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Chandra Multiwavelength Plane SurveyMeasuring the X-Ray Binary and Stellar Content of the Galaxy
The Chandra Multiwavelength Plane (ChaMPlane) Survey is a project to identify a large sample of serendipitous X-ray sources located to arcsec precision in deep ~> 20 ksec) galactic plane fields (|b| ~< 10 degree) imaged by the Chandra X-ray Observatory. These sources include cataclysmic variables (CVs), quiescent low mass X-ray binaries (qLMXBs: which includes both black hole and neutron star systems), Be X-ray binaries and stellar coronal sources (see Grindlay et al. (2005) for general description). The primary science objective of this project is to measure, or constrain, the luminosity functions of compact X-ray binaries and CVs. The ChaMPlane project is currently supported by NASA (Chandra Archive), NOAO, and NSF.
The figure is an optical Mosaic image of field centered on the black
hole X-ray nova GRO J0422+32 (stacked 10 dithered R images; total
exposure time: 2100 sec; North-left, west-up, FOV: 9'x9'). Chandra
ACIS chip boundaries (green lines) and X-ray source positions (red circles)
are superimposed on the image. Small green circles are the Chandra
optical counterparts. The small square in the center marks the Chandra
pointing aimpoint.
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