ChaMP X-ray Data Analysis
=========================


Review CXC SDP Data Products
----------------------------

Start with CXC Level 2 products.

Review V&V reports and the Issue table.

Check aspect quality 
	for absolute pointing (calibration alignment file) 
	and centroid of guide star and fid light (aspect quality plot).

Check good time interval (GTI) and grade distribution.
	Make sure whether data screening in the L2 processing was done properly.

Check number of events with forbidden BEV's flight grades.
	Make sure the number of those events is small



Additional Data Correction
--------------------------

Re-apply gain correction if a proper calibration file was not used (acis_process_events).

Re-apply bad-pixel correction if a proper calibration file was not used (acis_process_events).
    The new calibration bad-pixel file contains node boundaries 
    as well as hot/warm pixels so this step corrects node boundaries at the same time.

Remove ACIS flaring pixels (L. VanSpeybroeck's code)

Correct streaking for the S4 chip (J. Houck's code)



Additional Data Screening
-------------------------

Generate a background light curve per chip and
remove time intervals with high background rates (CIAO tools).
This step is important particularly in a BI chip.



Expmap
------

Generate an exposure map 
   chip-by-chip and
   in 3 energy bands (Soft:0.3-2.5, Hard:2.5-8.0, Broad:0.3-8.0 keV)
   (CIAO tools)


Source Detection
----------------

Run celldetect with varying detect cell sizes 
	depending on the off-axis angle (CIAO tool)

Run wavdetect with different scales (CIAO tool)

Applying a proper expmap is important not to detect 
	spurious sources at the chip edges.



Source Properties
-----------------

Determine source flux, extent, variability, X-ray color 
	and spectral parameters for strong sources

Tools are under development 



Cross-correlation with Optical Data
-----------------------------------

Revise absolute position if necessary
Compare X-ray and optical information such as X-ray to optical flux ratio.

Tools are under development 



Database
--------

Make all the information including observation parameter, 
data reduction parameters and source properties 
available in a convenient form such as ASCII table and SQL table.